MxTiSe2 (M = Cr, Mn, Cu) electronic structure study by methods of resonant X-ray photoemission spectroscopy and X-Ray absorption spectroscopy

摘要

Electronic structure and chemical bonding in TiX2 (X=S, Se, Te), TMxTiSe2(TM=Cr, Mn, Cu) and CrxTi1-xSe2 were studied by x-ray resonance photoemissionand absorption spectroscopy. These methods are detected to be strong sensitiveto chemical bonding. Charge transfer from the intercalated atoms to Ti 3d bandis detected. Narrow Ti 3d and Cu 3d bands are observed under Fermi level inCuxTiSe2.